搜索资源列表
sdr_c_trl_verilog
- SDRAM 控制器的Verilog代码 经过综合验证过的.无截压密码-SDRAM controller Verilog code comprehensive test after all. No cut-off pressure Password
Mrtos_RAMtest
- Mrtos开发板Ram测试程序，测试ram是否ok-Mrtos development board Ram test procedures, test ram is ok
FPGA-SRAMt-test
- 测试型号为EP2C5Q208C8的FPGA的RAM是否正常，按提示操作，并显示每步的测试结果-EP2C5Q208C8 test models for the FPGA' s RAM and whether it is normal, according to prompts, and display each step of the test results
c51
- 51单片机，USB，触摸，TFT,的等综合应用，高级别。（usb+flash+touch+tft+ram综合测试）-51 single-chip, USB, Touch, TFT, integrated applications (usb+ flash+ touch+ tft+ ram General Test)
planta_fagner
- is a test of a verilog implementation to do a oscilloscope with dual-port RAM
RS232capture
- This approach, we feel, came very close to obtaining an image from the camera OV7620. Before we tried to capture a camera signal, we successfully transferred a test image from the FPGA s onboard RAM modules through RS232 to the PC program. This file
VolumebetweentheendpointandexternalRAMtestloop
- 批量端点间和外部RAM环路测试，在KEIL中运行，适用于CYUSB的开发和仿真-Volume between the endpoint and external RAM test loop, in KEIL run for the development and simulation CYUSB
br_testRAM
- 文章给出了RAM测试的策略，并给出了流程图，可以方便的测试RAM的完好性。-In this paper, the strategy RAM test, and gives a flow chart can easily test the good of RAM.
SourceCode07_ExRam
- TMS320LF2812扩展外部RAM试验-Expansion of external RAM test TMS320LF2812
DualPort_RAM
- DualPort RAM 中文实验例程。-DualPort RAM Chinese test routines.
EasyFPGA060_Routine_RAM
- EasyFPGA060 RAM实验例程与文档-EasyFPGA060 RAM test routines and documentation
RAM
- ram code in VHDL with its test code
doc
- BIST for RAMs using ASTRA: Transparent Built-In Self Test (BIST) schemes for RAM modules assure the preservation of the memory contents during periodic testing. Symmetric transparent BIST skips the signature prediction phase required in traditional
ram
- 内部RAM的X，Y 单元中各存放一个带符号的数，试编程实现按如下条件进行的运算，并将结果存入Z单元中。-The internal RAM of the X, Y each storage unit signed a number of test programming operation carried out according to the following conditions and the results stored in Z units.
c8051f120
- C8051f120单片机的部分开发程序资源，其中包括了外部ram测试程序、单片机产生PWM载波、函数库、恒流源控制、交流恒流源-C8051f120 MCU part of the development program resources, including external ram test program, the microcontroller generates the PWM carrier, library, constant current source control, AC
DoubleRAM
- actel fpga kit 双端口RAM 实验-actel fpga kit dual-port RAM test
sram-test
- 静态RAM 的读写操作 测试文件，很适合初学者和相关工程人员-SRAM test DOC for engineer
ExRam
- dspF2812 RAM测试程序 包括gel文件，头文件、cmd文件和源文件-RAM test for DSPF2812
test
- The design shows how to use Dual port RAM in FPGA design